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Electron Backscatter Diffraction

 Electron backscatter diffraction (EBSD) is a technique used in the scanning electron microscope (SEM) to gather and explore quantitive microstructure analysis data such as, crystal orientation, phase grain statistics, phase and strain conditions and defects.
Electron Backscatter Diffraction

Visit the Analytical Components website for more information on Electron Backscatter Diffraction

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